The software provides measurements based on analysis of the fluorescence spectrum using the FP (Fundamental Parameter) method.
The auto-focus option is both mouse-activated and programmable as part of XY routine. It removes operator variability, improving measurement repeatability. Electronic part magnification up to 4X assists positioning and programming for small measurement sites.
Material identification enables identification of samples of any composition through comparison to a library of stored reference spectra. Users plating similar alloys can use this feature to confirm material composition before plating. It can also be used for material sorting/identification at incoming inspection.
The software is equipped with full statistical and SPC functions with computation for all statistical parameters. "Picture-in-Picture" test piece view and data display includes a quick zoom function. A print form template editor module allows set up of customer-specific formats with the ability to integrate the video image of the specimen or any other BMP file, saved as a Microsoft Word document.
Fischer Technology, Inc., 750 Marshall Phelps Road, Windsor, CT 06095. Tel: 860-683-0781; Fax: 860-688-8496.